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UCAM 068/16 (1) UHV Process Suite — Dual Beam Focused ion beam

The need to pattern electronic materials and devices by focused ion beam milling. This requires an integrated microscope system enabling both Ga-focused ion-beam milling and scanning electron beam imaging. The microscope chamber should be configured so that in-vacuum sample transfer to a separate deposition chamber is possible (but not included in the tender submission — details below). Sample space should be sufficient to accommodate an interchangeable sample-holder which accommodates 10 × 10 mm 2 . This is more fully described in the tender.

CPV-Code:

51430000

Abgabefrist:

Typ:

Contract award notice

Status:

Not applicable

Aufgabe:

Education

Vergabestelle:

name:	The Chancellor, Masters and Scholars of The University of Cambridge
address:	1st Floor South, Greenwich House, Madingley Rise
postal_code:	CB3 0TX
city:	Cambridge - UK
country:	UK
email:	None
phone:	+44 1223332233
contact_point:	Procurement Services
idate:	13. Juni 2020 01:04
udate:	13. Juni 2020 01:04
doc:	046433_2017.xml
authority_types:
activities:	EDUCATION

Quelle:

http://ted.europa.eu/udl?uri=TED:NOTICE:046433-2017:TEXT:EN:HTML

Unterlagen:

None

Zuschlagskriterium:

The most economic tender

Vertrag:

Supplies

Prozedur:

Open procedure

Nuts:

None

Veröffentlichung:

07.02.2017

Erfüllungsort:

Cambridge - GB

Link:

Lose:

Name	Los Nr 1 UCAM 068/16 (1) UHV Process Suite — Dual Beam Focused ion beam
Gewinner	Carl Zeiss Ltd
Datum
Wert	None
Anzahl Angebote	2

UCAM 068/16 (1) UHV Process Suite — Dual Beam Focused ion beam

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