Ausschreibungen

The SEM will be a thermal field emission scanning electron microscope designed for ultra-high resolution and greatest flexibility especially for EBSD analysis in conducting and poorly or non-conducting materials. It has to have a variable pressure and a charge compensation and cleaning unit fully integrated to and controlled by the software for the control of the SEM system. The resolution must be 0.8 nm or better at the optimum voltage level, 0.8 nm at 30 kV (STEM mode) and at 1 kV the resolution must be 1.6 nm or better. The SEM must have a range of acceleration voltages from 0.02 kV to 30 kV, variable in 10 V steps for maximum flexibility in demanding EBSD applications. The stability of the beam current should be better than 0.2 %/hour. The annular In-lens secondary electron and backscatter electron detectors must be included. A lens-mounted BSD detector has to be optimised both for traditional BSE Rutherford scattered BSE (atomic number contrast) and Low Angle BSE (Mott scattered BSE) for high-resolution channelling contrast (orientation contrast). WD from 1 mm must be possible. A HC/DoF-Module (High Current/Depth of Field) should be available providing parallel beam illumination and automatic tilt correction providing the depth of field at 70° tilt (EBSD application) in such a way that no dynamic focus is required. A large image storing and retrieving solution must be available allowing the maximum pixel resolution of 32768 x 24576 including automated multi-site image tiling and stitching. The price should be less than 400 000 EUR depending on the exact configuration.

Analytical Scanning Electron Microscope.

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Ausschreibungen zum Thema Scanning electron microscopes