Ausschreibungen

Description of equipment: — Transmission electron microscope (TEM); — Scanning electron microscope — physical sciences (SEM1); — Scanning electron microscope — life sciences (SEM2). Three complementary electron microscopes are requested, configured for high flexibility and high-throughput within a multi-user, multi-sample environment. Tenders are invited for all three instruments, or separate tenders for Lot 1 (TEM) and Lot 2 (SEM1 and SEM2), as appropriate. Purpose/statement of use: The new Nottingham Centre for Nanoscale Research (NCNR) will host this EM instrumentation, maximising use across a wide range of materials science programmes of interest to the partner Faculties of Engineering, Science and Health Sciences. Tenders will be reviewed by an Evaluation Panel drawing from the NCNR Steering Group Lot 1. TEM: Analytical TEM (80 to 200 kV operation voltage; high brightness LaB6 source; robust CCD; 0,23 nm point-to-point resolution), with STEM/HAADF and EDS & EELS (configured for simultaneous STEM mode mapping). The instrument should be supported by comprehensive software packages for auto-alignment and data analysis, along with specimen holders for chemical analysis (Be-holder, double tilt); heating (MEMS; up to 1 000°C); and cryogenic transfer. 3 years warranty and training. Lot 2. SEM1: Field emission gun scanning electron microscope (1.5 nm for SE and 2.5 nm for BSE resolution, respectively, at 30 kV) with EDX/WDX/EBSD; large chamber and in situ plasma cleaner. The instrument should be supported by comprehensive software packages for data analysis, along with in situ stages for heating (up to 750°C) and variable temperature strain measurements (200 N, -20°C to +160°C). Two additional FEG sources, 3 years warranty and training. SEM2: Conventional low vacuum or environmental SEM (3 nm for SE and 4 nm for BSE resolution, respectively, at 30 kV) with EDX; large chamber and in situ plasma cleaner (desirable). The instrument should be supported by comprehensive software packages for data analysis, along with and in situ stage for cooling (Peltier -30 to +45°C). 3 years warranty and training.

TEM SEM Equipment_2 Lots (ITT/720).

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Ausschreibungen zum Thema Electron microscopes