Ausschreibungen

The Atomic Force Microscope instrument is required to analyse samples which may be in a large scale array format semi-autonomously and at high speed (AFM scanning frequencies in excess of 100Hz should be possible). The microscope must be capable of operation in liquids ideally with a flow cell utilising a mode of analysis that provides quantitative analysis of surface topography and properties such as adhesion, dissipation and hardness. The AFM must be capable of localized force measurements. Samples may be of several centimetres in lateral dimension and a motorised computer controlled sample stage is essential (reproducibility better than 3 to 5 microns). The AFM should incorporate a high quality optical imaging system to visualise the AFM cantilever and sample. Closed loop operation of the piezo scanner is desirable as is the ability to image large areas and the use of small cantilevers with high resonant frequencies. The ability to carry out object tracking, panning and zooming in control of the AFM will be advantageous as will a package designed to deliver lithographic functionality. Suitable training and installation should be included. A service contract should also be included.

High Speed AFM Atomic Force Microscope 100Hz (ITT/540).

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Ausschreibungen zum Thema Scanning probe microscopes