DTU Nanolab will procure a Small Dual Beam (SDB) for sample analysis and preparation of samples in the range 5 nm thickness to >1 mm 3 . The tool will be able to carry out fully automated Electron and Ion Beam alignments, TEM Lamella preparation including pick and place onto TEM grids, automated 3D slice and view, capable of scripting using Python and able to be controlled for machine learning. Electron optics must achieve 0.6 nm nominal resolution 2-15 keV with a monochromated energy spread >200meV. Liquid metal (Ga) Ion source is not acceptable for this application. The FIB should be multi species focused gas plasma. In-column Energy filtering detectors are necessary for the successful imaging of the wide array of sample types analyzed/prepared at DTU Nanolab Remote operation is essential for everyday users and Service.
| CPV-Code: |
38511100
|
| Abgabefrist: |
|
| Typ: |
Voluntary ex ante transparency notice |
| Status: |
Not applicable |
| Aufgabe: |
Education |
| Vergabestelle: |
| name: |
Danmarks Tekniske Universitet — DTU |
| address: |
Anker Engelunds Vej 1 |
| postal_code: |
2800 |
| city: |
Kgs. Lyngby - DK |
| country: |
DK |
| email: |
None |
| phone: |
+45 45252525 |
| contact_point: |
Mikkel Bjerregaard Jensen |
| idate: |
1. Januar 2021 01:44 |
| udate: |
1. Januar 2021 01:44 |
| doc: |
580115_2020.xml |
| authority_types: |
|
| activities: |
|
|
| Quelle: |
http://ted.europa.eu/udl?uri=TED:NOTICE:580115-2020:TEXT:EN:HTML |
| Unterlagen: |
None |
| Zuschlagskriterium: |
Lowest price |
| Vertrag: |
Supplies |
| Prozedur: |
Negotiated without a prior call for competition |
| Nuts: |
None |
| Veröffentlichung: |
02.12.2020 |
| Erfüllungsort: |
Kgs. Lyngby - |
| Link: |
|
| Lose: |
| Name |
Los Nr 1 None |
| Gewinner |
FEI Europe BV, branch Denmark |
| Datum |
|
| Wert |
12 000 000,00 Dkr |
| Anzahl Angebote |
1 |
|